Key Takeaways
- ZEISS introduces the Crossbeam 750 FIB-SEM for optimized sample preparation
- The system provides live, high-resolution "see while you mill" view for immediate feedback and precise FIB cross sections
- ZEISS Crossbeam 750 features Gemini 4 electron optics for background-free, real-time endpointing and sub-nanometer precision
- Ideal for advanced semiconductor and materials workflows, as well as life sciences and nanofabrication
Introduction to ZEISS Crossbeam 750 FIB-SEM
The ZEISS Crossbeam 750 is a focused ion beam-scanning electron microscope (FIB-SEM) designed for demanding sample preparation. This system offers a live, high-resolution view of the sample during milling, allowing for immediate feedback and eliminating milling interruptions. The result is uniform first-pass transmission electron microscopy (TEM) lamellae and precise FIB cross sections.
Advanced Features and Capabilities
The ZEISS Crossbeam 750 features Gemini 4 electron optics, which delivers background-free, real-time endpointing and sub-nanometer precision for TEM lamellae and high-fidelity three-dimensional (3D) analysis. This makes it ideal for analysis of leading-node logic and memory devices, as well as nanofabrication and 3D volume imaging. For materials research and life sciences, the ZEISS Crossbeam 750 speeds acquisition times for 3D tomography through a larger field of view with reduced distortion.
Comparison of FIB-SEM Systems
| System | Electron Optics | Precision | Field of View |
|---|---|---|---|
| ZEISS Crossbeam 750 | Gemini 4 | Sub-nanometer | Large, reduced distortion |
| Other FIB-SEM Systems | Variable | Variable | Variable |
Applications and Benefits
The ZEISS Crossbeam 750 is essential for advanced semiconductor analysis, where precise, real-time control during FIB processing is critical. The system enables users to observe FIB-sample interactions in real time, fine-tune thinning and polishing steps, and achieve consistent lamella quality for leading-node logic and memory device workflows. In materials science, the ZEISS Crossbeam 750 is used for uniform TEM lamella preparation, atom probe tomography (APT), and other applications requiring high-resolution imaging and precise sample preparation.
Bottom Line
The ZEISS Crossbeam 750 FIB-SEM is a powerful tool for advanced sample preparation, offering live, high-resolution imaging and precise control during milling. With its Gemini 4 electron optics and large field of view, this system is ideal for a range of applications, from semiconductor analysis to materials science and life sciences. By providing immediate feedback and eliminating milling interruptions, the ZEISS Crossbeam 750 enables users to achieve consistent, high-quality results and drive scientific discovery forward.