CNC Milling

MetraSCAN BLACK2 adds stand-alone scanning and probing

MetraSCAN BLACK2 adds stand-alone scanning and probing

FARO CREAFORM, a business of AMETEK, Inc., announced the launch of MetraSCAN BLACK2, a portable metrology-grade optical 3D scanner for shop-floor inspection. Designed for quality control and quality assurance applications, the system supports multiple inspection workflows and provides certified accuracy under operating conditions.

MetraSCAN BLACK2 uses a 3-in-1 architecture that combines C-Track scanning, stand-alone scanning, and probing in one metrology-grade system. In C-Track mode, manufacturers can inspect large parts, while stand-alone mode supports portable scanning in confined or difficult-to-access areas. When paired with HandyPROBE, the system also supports probing inspections within the same workflow.

The system includes 46 blue laser lines and captures up to 2.8 million measurements per second. According to the company, data acquisition is approximately 56% faster than the previous generation. Its C-Track Flex Volume reaches 46.7 m³, compared with the previous system’s measurement volume, allowing larger parts to be inspected with fewer setups. Additional features include automatic shutter functionality, single-cable connectivity, and setup assistance tools.

Compared with MetraSCAN BLACK+ and BLACK+ Elite, MetraSCAN BLACK2 adds stand-alone scanning and supports parallel scanning and probing. The system also provides increased data acquisition speed and data density, while its connectivity and automation features are intended to simplify setup and operation. It is tested in ISO/IEC 17025-accredited calibration laboratories, with acceptance testing based on ISO 10360 and VDI/VDE 2634 Part 3.

FARO CREAFORM said MetraSCAN BLACK2 is designed to support portable metrology applications requiring inspection accuracy, productivity, and flexibility in manufacturing environments.

For more information, visit creaform3d.com.

The post MetraSCAN BLACK2 adds stand-alone scanning and probing appeared first on Engineering.com.

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